an isolated feature, such as a particle or pit, on or in a wafer surface, resulting in increased light scattering intensity relative to that of the surrounding wafer surface. [ASTM F1241] Also called light point defect . Contrast point defect.
an isolated feature, such as a particle or pit, on or in a wafer surface, resulting in increased light scattering intensity relative to that of the surrounding wafer surface. [ASTM F1241] Also called light point defect . Contrast point defect.